本文構(gòu)建了一種基于CAN 總線(xiàn)技術(shù)的電子產(chǎn)品批量自動(dòng)測(cè)試平臺(tái)，通過(guò)該平臺(tái)可以利用總線(xiàn)技術(shù)自動(dòng)完成電子產(chǎn)品的檢測(cè)。其核心是在CAN 總線(xiàn)之上附加一種自動(dòng)節(jié)點(diǎn)探測(cè)算法，這種探測(cè)算法將CAN 總線(xiàn)節(jié)點(diǎn)分為主節(jié)點(diǎn)和從節(jié)點(diǎn)，主節(jié)點(diǎn)將自動(dòng)檢測(cè)從節(jié)點(diǎn)，并對(duì)其進(jìn)行標(biāo)示。從節(jié)點(diǎn)在獲得標(biāo)示號(hào)后將自動(dòng)與主節(jié)點(diǎn)進(jìn)行測(cè)試信息交互，從而完成每個(gè)從節(jié)點(diǎn)上電子產(chǎn)品的檢測(cè)。
關(guān)鍵詞：CAN 總線(xiàn)，節(jié)點(diǎn)，探測(cè)算法
Abstract: A test platform of electronic products which based on the CAN bus technology
was constructed in this paper. As the bus technology used, this platform implemented the
electronic products test automatically. The key technology was the detection algorithm of auto node which added to the CAN bus. This algorithm divided the node of CAN bus into main node and sub-node. The main node would auto detect the sub-node, and mark it. Then the test information would be exchanged between sub-node and main node after the sub-node was marked, and the detection of the electronic products will be performed.
Key Words: CAN Bus, Node, Detection Algorithm