The T5375 is a General Purpose and High Performance Memory Test System.
This system has been designed to meet various requirement for the new generation VLSI memories and
evaluation of their characteristics and for the production of memories such as DRAM, SRAM, EPROM, Mask
ROM and Flash memories. T5375 contains the flash memory simultaneous measurement function as an
optional function.
During functional tests at a maximum test rate of 142.8MHz (7ns), the system ensure high timing accuracy,
high repeatability and high fault detect-ability. To meet the needs of increasing test time resulting from the
growing memory capacity, T5375 ensure high productivity by enabling up to 256 devices parallel testing at 2
stations. In additional to functional performance capabilities for various types of functional tests, highly
accurate timing and reference levels are provided which allows testing of NMOS, CMOS, TTL and other
devices at a station having 50 ohms characteristics. This system realizes miniaturization, low power and high
reliability by employing CMOS process.